STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun

H Sawada, Y Tanishiro, N Ohashi, T Tomita, F Hosokawa, T Kaneyama, Y Kondo and K. Takayanagi

Journal of Electron Microscopy 58 ( 6 ): 357 - 361 , 2009