Articles by T Kaneyama (3)

Correction of higher order geometrical aberration by triple 3-fold astigmatism field

H Sawada, T Sasaki, F Hosokawa, S Yuasa, M Terao, M Kawazoe, T Nakamichi, T Kaneyama, Y Kondo, K Kimoto and K. Suenaga

Journal of Electron Microscopy 58 ( 6 ): 341 - 347 , 2009

STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun

H Sawada, Y Tanishiro, N Ohashi, T Tomita, F Hosokawa, T Kaneyama, Y Kondo and K. Takayanagi

Journal of Electron Microscopy 58 ( 6 ): 357 - 361 , 2009

Direct imaging of lithium atoms in LiV2O4 by spherical aberration-corrected electron microscopy

Y Oshima, H Sawada, F Hosokawa, E Okunishi, T Kaneyama, Y Kondo, S Niitaka, H Takagi, Y Tanishiro and K. Takayanagi

Journal of Electron Microscopy 59 ( 6 ): 457 - 461 , 2010

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