J Shiue, C. S Chang, S. H Huang, C. H Hsu, J. S Tsai, W. H Chang, Y. M Wu, Y. C Lin, P. C Kuo, Y. S Huang, Y Hwu, J. J Kai, F. G Tseng and F. R. Chen
Journal of Electron Microscopy 58 ( 3 ): 137 - 145 , 2009